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Atomic Force Microscopy

Atomic Force Microscopy

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Veeco Nanoscope IIIa MultiMode Scanning Probe Microscope

Modes: Contact, Tapping, Nanoindenting/Scratching
Sample Prep: Maximum roughness: 1 micron, Sample no larger than 10mm in diamter and 5mm thick		 SPM
Veeco Nanoscope IIIa MultiMode Scanning Probe Microscope Sample Stage
  1. Select operation mode
  2. Mount the probe
  3. Select the scanner
  4. Mount the sample
  5. Align the laser
  6. Adjust the photodetector
 sample
Veeco NanoScope Software (Control Window)
  1. Set Scanning parameters: scan size, scan rate, scane angle and sample/lines
  2. Start scanning
 nanocontrol
Veeco NanoScope Software (Image Window)

This window provides the image, a summary of the settings used and information on the topography and cantilever position. 		nanoimage

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